See What’s Possible in Packaging & Processing @ PACK EXPO International
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X-ray systems with revolutionary advancement

HDRX imaging offers superior foreign material detection.

Peco Inspx SHIELD Allegro wide top-down X-ray inspection system
Peco Inspx SHIELD Allegro wide top-down X-ray inspection system

At PACK EXPO Las Vegas, Peco-InspX (peco-inspx.com) presented X-ray inspection systems incorporating HDRX imaging, which captures extremely high-resolution images of products at normal production line speeds. As a result, HDRX imaging dramatically improves minimum detectable size and expands the range of detectable foreign material in a wide variety of applications. The new technology is available across the Peco-InspX X-ray system product line, including side-view, top-down and dual-energy systems.

 

Learn more about Peco-InspX’s HDRX imaging atBooth 5238.

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