Microscan’s high-performance X-Mode products feature the industry’s leading decode algorithms for symbol location, analysis, and reconstruction right out of the box. Designed for the most difficult codes and challenging substrate materials, X-Mode algorithms decode any symbol (1D linear, 2D, or direct part mark) regardless of condition. Advanced pixel analysis and logic render damaged, distorted, poorly-printed, or skewed symbols readable using image processing to prevent data loss. For codes marked directly on parts, like dot peen marks on highly-reflective metal surfaces or inkjet codes printed on cardboard, X-Mode automatically enhances symbol appearance to gather critical symbol data and reliably interpret codes in both static and dynamic applications.
